Submolecular resolution in scanning probe images of Sn-phthalocyanines on Cu(1 0 0) using metal tips
- 1. Institut für Experimentelle und Angewandte Physik, Christian-Albrechts-Universität zu Kiel, D-24098 Kiel (Germany)
- 2. Institute for Molecules and Materials, Radboud University, 6525 AJ Nijmegen (Netherlands)
- 3. COMP, Department of Applied Physics, Aalto University, Otakaari 1, FI-00076 Helsinki (Finland)
Description
Single Sn-phthalocyanine (SnPc) molecules adsorb on Cu(1 0 0) with the Sn ion above (Sn-up) or below (Sn-down) the molecular plane. Here we use a combination of atomic force microscopy (AFM), scanning tunnelling microscopy (STM) and first principles calculations to understand the adsorption configuration and origin of observed contrast of molecules in the Sn-down state. AFM with metallic tips images the pyrrole nitrogen atoms in these molecules as attractive features while STM reveals a chirality of the electronic structure of the molecules close to the Fermi level which is not observed in AFM. Using density functional theory calculations, the origin of the submolecular contrast is analysed and, while the electrostatic forces turn out to be negligible, the van der Waals interaction between the phenyl rings of SnPc and the substrate deform the molecule, push the pyrrole nitrogen atoms away from the substrate and thus induce the observed submolecular contrast. Simulated STM images reproduce the chirality of the electronic structure near (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-648X/aa7dbdAdditional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 29
- Journal Issue
- 39
- Journal Page Range
- [5 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51029652
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; ATOMS; CHIRALITY; DENSITY FUNCTIONAL METHOD; FERMI LEVEL; METALS; MOLECULAR STRUCTURE; MOLECULES; NITROGEN; PHTHALOCYANINES; PYRROLES; SCANNING TUNNELING MICROSCOPY; TIN IONS; VAN DER WAALS FORCES
- Descriptors DEC
- AZOLES; CALCULATION METHODS; CHARGED PARTICLES; DYES; ELEMENTS; ENERGY LEVELS; HETEROCYCLIC COMPOUNDS; IONS; MICROSCOPY; NONMETALS; ORGANIC COMPOUNDS; ORGANIC NITROGEN COMPOUNDS; PARTICLE PROPERTIES; VARIATIONAL METHODS