Test of the leakage current and the junction capacitance for CdZnTe semiconductor detector

In order to study the characteristics of CdZnTe (CZT) semiconductor detector further, this article not only builds the test platform for the main characteristic parameters (the leakage current and the junction capacitance) and designs the test scheme, but also tests two detectors of different structures under different conditions and analyzes the test results. Through this experiment, we can better grasp the main features of the CZT detector, thus providing reference for its application in the field of radiation detection. (authors)