Published September 2013 | Version v1
Journal article

Concentric-annulus electrical capacitance tomography sensors

  • 1. Institute of Engineering Thermophysics, Chinese Academy of Sciences, Beijing 100190 (China)
  • 2. Department of Chemical Engineering and Biotechnology, University of Cambridge, Cambridge, CB3 0HE (United Kingdom)
  • 3. School of Electrical and Electronic Engineering, The University of Manchester, Manchester, M13 9PL (United Kingdom)

Description

The aim of this research is to investigate the unique shape (concentric-annulus) electrical capacitance tomography (ECT) sensors. This is motivated by the desire to improve the contrast and spatial resolution of the images reconstructed using ECT sensors with internal–external electrodes (IEEs). Both numerical simulation and experimental study were carried out with the goal of providing an improved understanding of the configuration of IEE sensors, the internal shield and the measurement strategies. Simulation results are in agreement with the experimental results. Using the linear back projection algorithm, the IEE sensor with 12 external electrodes and 4 internal electrodes with the external–opposite–internal measurement strategy can reconstruct high-quality images. In experimental studies, the internal shield may reduce the quality of capacitance measured from the internal electrodes. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/24/9/095403

Additional details

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
24
Journal Issue
9
Journal Page Range
[12 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46018443
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ALGORITHMS; CAPACITANCE; COMPUTERIZED SIMULATION; ELECTRODES; IMAGE PROCESSING; IMAGES; MEASURING METHODS; SENSORS; SPATIAL RESOLUTION; TOMOGRAPHY
Descriptors DEC
DIAGNOSTIC TECHNIQUES; ELECTRICAL PROPERTIES; MATHEMATICAL LOGIC; PHYSICAL PROPERTIES; PROCESSING; RESOLUTION; SIMULATION