Concentric-annulus electrical capacitance tomography sensors
- 1. Institute of Engineering Thermophysics, Chinese Academy of Sciences, Beijing 100190 (China)
- 2. Department of Chemical Engineering and Biotechnology, University of Cambridge, Cambridge, CB3 0HE (United Kingdom)
- 3. School of Electrical and Electronic Engineering, The University of Manchester, Manchester, M13 9PL (United Kingdom)
Description
The aim of this research is to investigate the unique shape (concentric-annulus) electrical capacitance tomography (ECT) sensors. This is motivated by the desire to improve the contrast and spatial resolution of the images reconstructed using ECT sensors with internal–external electrodes (IEEs). Both numerical simulation and experimental study were carried out with the goal of providing an improved understanding of the configuration of IEE sensors, the internal shield and the measurement strategies. Simulation results are in agreement with the experimental results. Using the linear back projection algorithm, the IEE sensor with 12 external electrodes and 4 internal electrodes with the external–opposite–internal measurement strategy can reconstruct high-quality images. In experimental studies, the internal shield may reduce the quality of capacitance measured from the internal electrodes. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/24/9/095403Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 24
- Journal Issue
- 9
- Journal Page Range
- [12 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46018443
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; CAPACITANCE; COMPUTERIZED SIMULATION; ELECTRODES; IMAGE PROCESSING; IMAGES; MEASURING METHODS; SENSORS; SPATIAL RESOLUTION; TOMOGRAPHY
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; ELECTRICAL PROPERTIES; MATHEMATICAL LOGIC; PHYSICAL PROPERTIES; PROCESSING; RESOLUTION; SIMULATION