Published September 1, 2007 | Version v1
Journal article

Challenges and benefits of designing readout ASICs in advanced technologies

Creators

  • 1. Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, Cracow (Poland)

Description

Basic trends in scaling CMOS technologies are reviewed briefly putting emphasis on advantages and limitations to designing readout ASIC. Scaling of noise performance in deep submicron MOSFETs is discussed in context of application in front-end circuits. A comparison of noise performance in deep submicron MOS transistors and in bipolar transistors is presented. Scaling of matching performance is reviewed and impacts on designing analogue circuits are discussed. Design challenges for mixed-signal ASICs related to analogue modelling, substrate coupling of digital noise, speed vs. power optimisation are reviewed briefly. Radiation effects in deep submicron CMOS technologies are reviewed and radiation hardening strategy towards Super LHC applications is discussed

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2007.05.302

Additional details

Identifiers

DOI
10.1016/j.nima.2007.05.302;
PII
S0168-9002(07)01190-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
579
Journal Issue
2
Journal Page Range
p. 821-827
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
6. 'Hiroshima' symposium on the development and application of semiconductor detectors
Dates
11-15 Sep 2006
Place
Carmel, CA (United States)

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.