Published June 2011 | Version v1
Journal article

A holographic biprism as a perfect energy filter?

  • 1. EMAT, University of Antwerp, Groenenborgerlaan 171 B-2020, Antwerp (Belgium)
  • 2. Italian Institute of Technology (IIT), via Morego 30, IT-16163 Genoa (Italy)
  • 3. Triebenberglabor, Dresden University, D-01062 Dresden (Germany)

Description

It has often been stated that a holographic biprism represents a near perfect energy filter and only elastically scattered electrons can participate in the interference fringes. This is based on the assumption that the reference wave does not contain inelastically scattered electrons. In this letter we show that this is not exactly true because of the delocalised inelastic interaction of the reference wave with the sample. We experimentally and theoretically show that inelastic scattering plays a role in the fringe formation, but it is shown that this contribution is small and can usually be neglected in practice. -- Research highlights: → It is common wisdom that in electron holography only elastic scattering contributes to the fringe pattern. → We demonstrate experimentally that this concept is wrong. → We show theoretically that by including delocalised inelastic scattering also inelastically scattered electrons contribute to the fringe pattern. → The effect is found to be small and inelastic events with energy losses above 5 eV should not considerably influence the reconstructed wave in conventional off-axis electron holography.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2011.01.042

Additional details

Identifiers

DOI
10.1016/j.ultramic.2011.01.042;
PII
S0304-3991(11)00066-0;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
111
Journal Issue
7
Journal Page Range
p. 887-893
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45025376
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ELASTIC SCATTERING; ELECTRONS; ENERGY LOSSES; ENERGY-LOSS SPECTROSCOPY; EV RANGE; FILTERS; HOLOGRAPHY; INELASTIC SCATTERING; INTERFERENCE
Descriptors DEC
ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; LEPTONS; LOSSES; SCATTERING; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.