Published April 1, 1981
| Version v1
Journal article
Thick target PIXE analysis and yield curve calculations
Creators
- 1. Australian Atomic Energy Commission Research Establishment, Lucas Heights
Description
Four computer programs used for thick target proton induced X-ray emission (PIXE) research at the Australian Atomic Energy Commission are discussed. Different techniques of spectrum analysis are considered and a description is given of the spectrum synthesis code PUCK used in our analysis. Attention is focused on the use of theoretical thick target yield curves as a means of obtaining quantitative information on trace element concentration. Finally, several applications indicating the versatility of thick target PIXE analysis are mentioned. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods
- Journal Volume
- 180
- Journal Issue
- 2/3
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 541-548
- ISSN
- 0029-554X
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 12628944
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPUTER CALCULATIONS; COMPUTER CODES; DATA PROCESSING; ELEMENTS; P CODES; QUANTITATIVE CHEMICAL ANALYSIS; TRACE AMOUNTS; X-RAY EMISSION ANALYSIS; X-RAY SPECTRA
- Descriptors DEC
- CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; SPECTRA