Published September 1986
| Version v1
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Semiconductor detectors and readout electronics: present directions and outstanding problems
Description
A brief discussion is given of the status of semiconductor detectors, including microstrip detectors, charge-coupled devices, and semiconductor drift devices. Radiation damage and monolithic integration of readout electronics are also covered
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE87001464.Files
18052834.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 10 p.
- Report number
- BNL--38692
Conference
- Title
- 4. European symposium on semiconductor detectors.
- Dates
- 3-5 Mar 1986.
- Place
- Munich (Germany, F.R.).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18052834
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; FEASIBILITY STUDIES; PHYSICAL RADIATION EFFECTS; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; SEMICONDUCTOR DETECTORS
- Descriptors DEC
- MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES
Optional Information
- Secondary number(s)
- CONF-8603109--7.