Published 1999
| Version v1
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Radiation effects on active pixel sensors (APS)
Creators
- 1. ONERA-CERT/, 31 - Toulouse (France)
Description
Active pixel sensor (APS) is a new generation of image sensors which presents several advantages relatively to charge coupled devices (CCDs) particularly for space applications (APS requires only 1 voltage to operate which reduces considerably current consumption). Irradiation was performed using 60Co gamma radiation at room temperature and at a dose rate of 150 Gy(Si)/h. 2 types of APS have been tested: photodiode-APS and photoMOS-APS. The results show that photoMOS-APS is more sensitive to radiation effects than photodiode-APS. Important parameters of image sensors like dark currents increase sharply with dose levels. Nevertheless photodiode-APS sensitivity is one hundred time lower than photoMOS-APS sensitivity
Availability note (English)
Available from INIS in electronic formFiles
34078072.pdf
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Additional details
Additional titles
- Original title (English)
- Effets de l'irradiation sur les capteurs a pixels actifs (APS)
Publishing Information
- Imprint Pagination
- [3 p.]
- Report number
- INIS-FR--2078
Conference
- Title
- 5. European conference on radiation and its effects on components and systems
- Original Conference Title
- 5. congres europeen les radiations et leurs effets sur les composants et les systemes
- Dates
- 13-17 Sep 1999
- Place
- Abbaye de Fontevraud (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 34078072
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; PERFORMANCE TESTING; PHOTODIODES; PHOTOTRANSISTORS; PHYSICAL RADIATION EFFECTS; POST-IRRADIATION EXAMINATION
- Descriptors DEC
- RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TESTING; TRANSISTORS
Optional Information
- Notes
- 7 refs.