Published 1999 | Version v1
Miscellaneous Open

Radiation effects on active pixel sensors (APS)

Description

Active pixel sensor (APS) is a new generation of image sensors which presents several advantages relatively to charge coupled devices (CCDs) particularly for space applications (APS requires only 1 voltage to operate which reduces considerably current consumption). Irradiation was performed using 60Co gamma radiation at room temperature and at a dose rate of 150 Gy(Si)/h. 2 types of APS have been tested: photodiode-APS and photoMOS-APS. The results show that photoMOS-APS is more sensitive to radiation effects than photodiode-APS. Important parameters of image sensors like dark currents increase sharply with dose levels. Nevertheless photodiode-APS sensitivity is one hundred time lower than photoMOS-APS sensitivity

Availability note (English)

Available from INIS in electronic form

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Additional details

Additional titles

Original title (English)
Effets de l'irradiation sur les capteurs a pixels actifs (APS)

Publishing Information

Imprint Pagination
[3 p.]
Report number
INIS-FR--2078

Conference

Title
5. European conference on radiation and its effects on components and systems
Original Conference Title
5. congres europeen les radiations et leurs effets sur les composants et les systemes
Dates
13-17 Sep 1999
Place
Abbaye de Fontevraud (France)

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
34078072
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE-COUPLED DEVICES; PERFORMANCE TESTING; PHOTODIODES; PHOTOTRANSISTORS; PHYSICAL RADIATION EFFECTS; POST-IRRADIATION EXAMINATION
Descriptors DEC
RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TESTING; TRANSISTORS

Optional Information

Notes
7 refs.