Measurements of photon mass attenuation coefficients for Ge and BGO crystals at 10 MeV
Creators
- 1. Japan Atomic Energy Agency, Tokai, Ibaraki (Japan)
- 2. National Inst. of Advanced Industrial Science and Technology, Tsukuba, Ibaraki (Japan)
- 3. Konan Univ., Kobe, Hyogo (Japan)
Description
The photon mass attenuation coefficients of the important materials for γ-ray detection, Ge and BGO (Bi4Ge3O12) crystals, have been measured for 10.0 MeV γ-rays. The measurement system using the laser-Compton backscattering γ-rays and the high-resolution high-energy photon spectrometer has been developed and utilized. The effectiveness of the system achieving the total systematic uncertainties of 0.5% for the measurements of the photon mass attenuation coefficients was demonstrated. It was shown that the measured photon mass attenuation coefficients, 318.1±1.7 [cm2/g] for the Ge crystal and 425.2±2.4 [cm2/g] for the BGO crystal, agree within the achieved experimental uncertainties with the evaluated values including atomic and nuclear processes at 10.0 MeV. (author)
Additional details
Identifiers
- DOI
- 10.3327/jnst.45.1228;
Publishing Information
- Journal Title
- Journal of Nuclear Science and Technology (Tokyo)
- Journal Volume
- 45
- Journal Issue
- 11
- Journal Page Range
- p. 1228-1232
- ISSN
- 0022-3131
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 40016834
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATTENUATION; BACKSCATTERING; BISMUTH OXIDES; COMPTON EFFECT; CRYSTALS; GAMMA DETECTION; GAMMA RADIATION; GAMMA SPECTROMETERS; GERMANIUM; GERMANIUM OXIDES; LASERS; MASS; MEV RANGE 01-10; PHOTONS
- Descriptors DEC
- BASIC INTERACTIONS; BISMUTH COMPOUNDS; BOSONS; CHALCOGENIDES; DETECTION; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; GERMANIUM COMPOUNDS; INTERACTIONS; IONIZING RADIATIONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; METALS; MEV RANGE; OXIDES; OXYGEN COMPOUNDS; RADIATION DETECTION; RADIATIONS; SCATTERING; SPECTROMETERS
Optional Information
- Notes
- Available from doi: http://dx.doi.org/10.3327/jnst.45.1228; 15 refs., 7 figs., 1 tab.