Sintered polycrystalline BiVO pellet for stable X-ray detector with low detection limit
- 1. Key Laboratory of Applied Surface and Colloid Chemistry, Ministry of Education, Shaanxi Key Laboratory for Advanced Energy Devices, Shaanxi Engineering Lab for Advanced Energy Technology, Institute for Advanced Energy Materials, School of Materials Science and Engineering, Shaanxi Normal University, Xi'an, 710119 (China)
- 2. Dalian National Laboratory for Clean Energy, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian, 116023 (China)
Description
Semiconductors based on Bi element show large attenuation coefficients to X-ray photons and have been recognized as candidates for X-ray detectors. However, the application of stable Bi-based oxide materials to X-ray detectors has been rarely investigated. In this research, the X-ray response of a BiVO pellet has been studied. It has been found that the BiVO pellet has a large resistivity of 1.3 × 10 Ω cm, negligible current drift of 6.18 × 10 nA cm s V under electrical bias and mobility lifetime product, µτ, of 1.75 × 10 cm V, which renders the pellet with an X-ray sensitivity of 241.3 µC Gy cm and a detection limit of 62 nGy s under 40 KVp X-ray illumination and 40 V bias voltage. The BiVO pellet also shows operational stability under steady X-ray illumination with total dose of 2.01 Gy, equal to the dose of 20 000 medical chest X-ray inspections. This research reveals the potential application of BiVO in X-ray detection devices and inspires further research in this area. (© 2023 Wiley‐VCH GmbH)
Availability note (English)
Available from: http://dx.doi.org/10.1002/adfm.202213563Additional details
Identifiers
Publishing Information
- Journal Title
- Advanced Functional Materials (Internet)
- Journal Volume
- 33
- Journal Issue
- 16
- Journal Page Range
- p. 1-7
- ISSN
- 1616-3028
- CODEN
- AFMDC6
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 54055254
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BIOMEDICAL RADIOGRAPHY; BISMUTH COMPOUNDS; DARK CURRENT; POLYCRYSTALS; SEMICONDUCTOR MATERIALS; SENSITIVITY; SINTERED MATERIALS; STABILITY; VANADATES; X-RAY DETECTION
- Descriptors DEC
- CRYSTALS; CURRENTS; DETECTION; DIAGNOSTIC TECHNIQUES; ELECTRIC CURRENTS; LEAKAGE CURRENT; MATERIALS; MEDICINE; NUCLEAR MEDICINE; OXYGEN COMPOUNDS; RADIATION DETECTION; RADIOLOGY; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Notes
- AID: 2213563