Porosity detection in ceramic armor tiles via ultrasonic time-of-flight
- 1. Center for Nondestructive Evaluation, Iowa State University, Ames, IA 50011 (United States)
Description
Some multilayer armor panels contain ceramic tiles as one constituent, and porosity in the tiles can affect armor performance. It is well known that porosity in ceramic materials leads to a decrease in ultrasonic velocity. We report on a feasibility study exploring the use of ultrasonic time-of-flight (TOF) to locate and characterize porous regions in armor tiles. The tiles in question typically have well-controlled thickness, thus simplifying the translation of TOF data into velocity data. By combining UT velocity measurements and X-ray absorption measurements on selected specimens, one can construct a calibration curve relating velocity to porosity. That relationship can then be used to translate typical ultrasonic C-scans of TOF-versus-position into C-scans of porosity-versus-position. This procedure is demonstrated for pulse/echo, focused-transducer inspections of silicon carbide (SiC) ceramic tiles.
Additional details
Identifiers
- DOI
- 10.1063/1.3592051;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1335
- Journal Issue
- 1
- Journal Page Range
- p. 1037-1044
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- Review of progress in quantitative nondestructive evaluation
- Dates
- 18-23 Jul 2010
- Place
- San Diego, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42103349
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ARMOR; CALIBRATION; CERAMICS; FEASIBILITY STUDIES; INSPECTION; LAYERS; POROSITY; POROUS MATERIALS; PULSES; SILICON CARBIDES; THICKNESS; TIME-OF-FLIGHT METHOD; TRANSDUCERS; VELOCITY; X RADIATION
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; DIMENSIONS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATERIALS; RADIATIONS; SILICON COMPOUNDS; SORPTION
Optional Information
- Notes
- (c) 2011 American Institute of Physics