Published June 23, 2011 | Version v1
Journal article

Porosity detection in ceramic armor tiles via ultrasonic time-of-flight

  • 1. Center for Nondestructive Evaluation, Iowa State University, Ames, IA 50011 (United States)

Description

Some multilayer armor panels contain ceramic tiles as one constituent, and porosity in the tiles can affect armor performance. It is well known that porosity in ceramic materials leads to a decrease in ultrasonic velocity. We report on a feasibility study exploring the use of ultrasonic time-of-flight (TOF) to locate and characterize porous regions in armor tiles. The tiles in question typically have well-controlled thickness, thus simplifying the translation of TOF data into velocity data. By combining UT velocity measurements and X-ray absorption measurements on selected specimens, one can construct a calibration curve relating velocity to porosity. That relationship can then be used to translate typical ultrasonic C-scans of TOF-versus-position into C-scans of porosity-versus-position. This procedure is demonstrated for pulse/echo, focused-transducer inspections of silicon carbide (SiC) ceramic tiles.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1335
Journal Issue
1
Journal Page Range
p. 1037-1044
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
Review of progress in quantitative nondestructive evaluation
Dates
18-23 Jul 2010
Place
San Diego, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42103349
Subject category
S07: ISOTOPES AND RADIATION SOURCES; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; ARMOR; CALIBRATION; CERAMICS; FEASIBILITY STUDIES; INSPECTION; LAYERS; POROSITY; POROUS MATERIALS; PULSES; SILICON CARBIDES; THICKNESS; TIME-OF-FLIGHT METHOD; TRANSDUCERS; VELOCITY; X RADIATION
Descriptors DEC
CARBIDES; CARBON COMPOUNDS; DIMENSIONS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATERIALS; RADIATIONS; SILICON COMPOUNDS; SORPTION

Optional Information

Notes
(c) 2011 American Institute of Physics