Published November 12, 1991 | Version v1
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X-ray studies of microstructures in semiconductors and superconducting materials

Description

Several different experimental investigations were carried out during the present report period. These include x-ray studies of semiconductors, high-Tc superconductors, and various thin films using synchrotron radiation (especially soft x-ray experiments by means of our new detector) and measurements of some fundamental properties of new superconducting materials made in our laboratory at Buffalo. We have made the first systematic study of electronic structure in the high-Tc superconductors La2-xSrxCuO4 with x ranging from 0 to 0.15 by x-ray absorption spectroscopy (XAS)

Availability note (English)

MF available from INIS under the Report Number; OSTI as DE92003663; NTIS; INIS; US Govt. Printing Office Dep.

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Additional details

Additional titles

Subtitle (English)
Annual technical progress report, July 1, 1990--June 30, 1991

Publishing Information

Imprint Pagination
9 p.
Report number
DOE/ER/45283--10

Optional Information

Contract/Grant/Project number
Contract FG02-87ER45283
Funding organization
USDOE, Washington, DC (United States).