Published October 2006 | Version v1
Journal article

Optimization of gated x-ray intensifier screens

  • 1. Lexel Imaging Systems Inc., Lexington, Kentucky 40511 (United States)
  • 2. Deposition Research Laboratory Inc., St. Charles, Missouri 63301 (United States)
  • 3. Los Alamos National Laboratory, Los Alamos, New Mexico (United States)

Description

Gated x-ray intensifiers are primary imaging diagnostics in high energy density physics and inertial confinement fusion experiments. We describe recent work in optimization of the phosphor screens used in these intensifiers. One avenue for improvement in resolution, contrast, and brightness is improved phosphor screens. Efforts have been directed at improving luminosity, resolution, and contrast with an aluminized thin (<0.7 μg/cm2) phosphor layer, a higher transmission indium tin oxide (ITO) electrode, and higher density screens. Thinner phosphors, coupled with thinner aluminum overcoats (<500 A ring ), should give equivalent or higher luminosities than traditional thick (<0.7μg/cm2) settled coatings in the electron energy range between 3 and 5 kV, typical microchannel plate to screen accelerating voltages for this class of instrument. Higher resolution is achieved by coupling increased extraction voltage (ph/e-) with less interparticle photon diffusion and increased photon capture (aluminum overcoat). The contribution of the aluminum overcoat to capturing backscattered screen photons is examined. Improved transmission of an ITO electrode used in the cataphoretic deposition technique is demonstrated

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
77
Journal Issue
10
Journal Page Range
p. 10E313
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2006 American Institute of Physics