Crack-free micromachining on glass substrates by visible LIBWE using liquid metallic absorbers
Creators
- 1. Research Center for Applied Sciences, Academia Sinica, Taipei, Taiwan (China)
- 2. Institute of Biomedical Engineering, National Taiwan University, Taiwan (China)
- 3. Leibniz Institute of Surface Modification, Leipzig (Germany)
- 4. Institute of Biophotonics, National Yang-Ming University, Taiwan (China)
- 5. Department of Mechanical and Mechatronic Engineering, National Taiwan Ocean University, Taiwan (China)
Description
Laser induced backside wet etching (LIBWE) is a promising laser direct-write technique for etching transparent materials and for producing high precision and near-optical quality surfaces. In this study, visible LIBWE using gallium and eutectic indium/gallium as absorbers was used for crack-free microfabrication of sodalime and quartz. Eutectic indium/gallium (In/Ga) has a melting temperature lower than metallic gallium does and the etching rate by using In/Ga was found to be similar to that by gallium for visible LIBWE. When using the gallium absorber, the etching threshold of quartz by visible LIBWE was about one-third of that by UV LIBWE. The heat-affected zone of the quartz etching was negligible at the trench rim in the visible LIBWE process. The wettability of the metallic absorbers on the substrates affects aspect ratio and is a new important factor for LIBWE. In addition, etching rate decreased when repetition rate was increased.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.06.041Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.06.041;
- PII
- S0169-4332(10)00860-3;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 257
- Journal Issue
- 1
- Journal Page Range
- p. 87-92
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44018848
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABLATION; ACCURACY; ASPECT RATIO; CRACKS; ETCHING; EUTECTICS; GALLIUM; GLASS; HEAT AFFECTED ZONE; INDIUM; LASER RADIATION; LIQUIDS; MELTING POINTS; RESONANCE IONIZATION MASS SPECTROSCOPY; SUBSTRATES; SURFACES; WETTABILITY
- Descriptors DEC
- DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; MASS SPECTROSCOPY; METALS; PHYSICAL PROPERTIES; RADIATIONS; SPECTROSCOPY; SURFACE FINISHING; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE; ZONES
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.