Published April 2007
| Version v1
Journal article
Noise in Frequency Modulation-Dynamic Force Microscopy
- 1. CSEM SA, rue Jaquet-Droz 1, Case Postale, CH-2002 Neuchatel (Switzerland)
- 2. GNS-CEMES-CNRS, 29 rue Jeanne Marvig, F-31055 Toulouse (France)
Description
Analytical expressions giving the noise power spectral densities of the signals of interest in frequency modulation-dynamic force microscopy are derived. They are validated by comparison with numerical simulations performed with a realistic virtual force microscope. Thermal noise as well as detection noise are considered. A tip-substrate interaction incorporating a van der Waals and a Morse potential is considered as an illustrative example
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 61
- Journal Issue
- 1
- Journal Page Range
- p. 949-954
- ISSN
- 1742-6596
Conference
- Title
- International conference on nanoscience and technology
- Dates
- 30 Jul - 4 Aug 2006
- Place
- Basel (Switzerland)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38078045
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; FREQUENCY MODULATION; MICROSCOPY; MORSE POTENTIAL; NOISE; SPECTRAL DENSITY; SUBSTRATES; VAN DER WAALS FORCES
- Descriptors DEC
- EVALUATION; FUNCTIONS; MODULATION; POTENTIALS; SIMULATION; SPECTRAL FUNCTIONS