Conductance resonance studies of gold cluster-assembled nanofilms
Creators
- 1. Department of Physics and National Laboratory of Solid State, Microstructures, Nanjing University, Nanjing, 210093 (China)
Description
STM/STS are used to study single electron tunneling effect of gold clusters deposited on H-terminated Si crystal substrate. We find that the gold clusters are randomly stacking up on the surface of the substrate and sharp conductance resonance peaks appear when the tip of STM is positioned right above the top of one of the Au clusters while they disappear when the tip approaches towards the boundaries between the clusters on the nanofilm. Furthermore, the conductance peaks are not equidistant with fine structures and negative differential resistances (NDR) are observed at bias voltage higher than 0.3 V. By the generalized Breit-Wigner formula in a tight-binding approximation we find that in the conductance resonance the multi-peak structure may come from the interaction between Au clusters of the cluster-assembled nanofilm and the different arrangement of Au clusters may cause difference of the conductance resonance
Additional details
Identifiers
- DOI
- 10.1063/1.54521;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 416
- Journal Issue
- 1
- Journal Page Range
- p. 338-347
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- Symposium on similarities and differences between atomic nuclei and clusters
- Dates
- 1-4 Jul 1997
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40053826
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BREIT-WIGNER FORMULA; CLUSTER BEAMS; CRYSTALS; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRONS; ENERGY BEAM DEPOSITION; FINE STRUCTURE; GOLD; NANOSTRUCTURES; RESONANCE; SCANNING TUNNELING MICROSCOPY; SILICON; SOLID CLUSTERS; SUBSTRATES; SURFACES; TUNNEL EFFECT
- Descriptors DEC
- BEAMS; DEPOSITION; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; METALS; MICROSCOPY; PHYSICAL PROPERTIES; SEMIMETALS; SURFACE COATING; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 1997 American Institute of Physics.