Published February 1, 2004
| Version v1
Report
Radiation aging of stockpile and space-based microelectronics
Description
This report describes an LDRD-supported experimental-theoretical collaboration on the enhanced low-dose-rate sensitivity (ELDRS) problem. The experimental work led to a method for elimination of ELDRS, and the theoretical work led to a suite of bimolecular mechanisms that explain ELDRS and is in good agreement with various ELDRS experiments. The model shows that the radiation effects are linear in the limit of very low dose rates. In this limit, the regime of most concern, the model provides a good estimate of the worst-case effects of low dose rate ionizing radiation
Availability note (English)
Available from http://infoserve.sandia.gov/sand_doc/2003/034783.pdf; PURL: https://www.osti.gov/servlets/purl/918391-CBYhgy/Additional details
Identifiers
Publishing Information
- Imprint Pagination
- 20 p.
- Report number
- SAND--2003-4783
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 39104621
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- AGING; DOSE RATES; IONIZING RADIATIONS; LOW DOSE IRRADIATION; MICROELECTRONICS; RADIATION EFFECTS; SENSITIVITY; STOCKPILES
- Descriptors DEC
- IRRADIATION; RADIATIONS
Optional Information
- Contract/Grant/Project number
- AC04-94AL85000
- Notes
- doi 10.2172/918391
- Funding organization
- US Department of Energy (United States)