Published April 21, 2010
| Version v1
Journal article
Vibronic coupling density analysis for α-oligothiophene cations: A new insight for polaronic defects
- 1. Department of Molecular Engineering, Graduate School of Engineering, Kyoto University, Kyoto 615-8510 (Japan)
- 2. Fukui Institute for Fundamental Chemistry, Kyoto University, Takano-Nishihiraki-cho 34-4, Sakyo-ku, Kyoto 606-8103 (Japan)
Description
Graphical abstract: Electron-density difference is distributed mainly in the central four thiophene rings, suggesting that the polaronic defect occurs in the four rings. - Abstract: Vibronic coupling density (VCD) analyses for α,α'-oligothiophenes (denoted α-nT, where n stands for the number of thiophene rings) cations are presented. VCD analysis can reveal the origin of vibronic couplings based on the electronic and vibrational structures. We can gain a new insight for the reason why a polaronic defect of α-oligothiophenes occurs mainly in four thiophene rings for even n and at most five thiophene rings for odd n. A role of electron-density difference in the formation of polaronic defects is discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.chemphys.2010.03.014Additional details
Identifiers
- DOI
- 10.1016/j.chemphys.2010.03.014;
- PII
- S0301-0104(10)00107-2;
Publishing Information
- Journal Title
- Chemical Physics
- Journal Volume
- 369
- Journal Issue
- 2-3
- Journal Page Range
- p. 108-121
- ISSN
- 0301-0104
- CODEN
- CMPHC2
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43125613
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- CATIONS; COUPLING; COUPLINGS; ELECTRON DENSITY; ELECTRONS; INTERACTIONS; ORGANIC SEMICONDUCTORS; POLYCYCLIC SULFUR HETEROCYCLES; THIOPHENE
- Descriptors DEC
- CHARGED PARTICLES; ELEMENTARY PARTICLES; FERMIONS; HETEROCYCLIC COMPOUNDS; IONS; LEPTONS; MATERIALS; ORGANIC COMPOUNDS; ORGANIC SULFUR COMPOUNDS; SEMICONDUCTOR MATERIALS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.