Published 2003
| Version v1
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Distribution profile of lithium in surficial region of Si1-xGex solid solutions
Creators
- 1. Physical-Technical Institute AS RU, NPO 'Physics-Sun', Tashkent (Uzbekistan)
- 2. South Kazakhstan Auezov State University, Shymkent (Kazakhstan)
- 3. Gulistan State University, Gulistan (Uzbekistan)
Description
no abstract available
Files
39121175.pdf
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Additional details
Additional titles
- Original title (Russian)
- Профил' распределения лития в приповерхностной области твердых растворов Си
Publishing Information
- Publisher
- Fiziko-tekhnicheskij institut, NPO 'Fizika-Solntse'
- Imprint Place
- Tashkent (Uzbekistan)
- Imprint Title
- Proceedings of the conference 'Fundamental and applied problems of physics'
- Imprint Pagination
- 494 p.
- Journal Page Range
- p. 271-272
- Report number
- INIS-UZ--133
Conference
- Title
- Conference on Fundamental and applied problems of physics consecrated to 60th anniversary of the Academy of Sciences of Uzbekistan and Physical-Technical Institute
- Original Conference Title
- Konferentsiya 'Fundamental'nye i prikladnye voprosy fiziki' posvyashchennaya 60--letiyu Akademii Nauk Respubliki Uzbekistan i Fiziko-Tekhnicheskogo Instituta
- Dates
- 27-28 Nov 2003
- Place
- Tashkent (Uzbekistan)
INIS
- Country of Publication
- Uzbekistan
- Country of Input or Organization
- Uzbekistan
- INIS RN
- 39121175
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- GERMANIUM; LI-DRIFTED GE DETECTORS; LI-DRIFTED JUNCTION DETECTORS; LI-DRIFTED SI DETECTORS; MAGNETORESISTANCE; N-TYPE CONDUCTORS; P-TYPE CONDUCTORS; PHOTOCONDUCTIVITY; PHOTOSENSITIVITY; RADIOSENSITIVITY; SILICON; SOLID SOLUTIONS; THERMAL DEGRADATION
- Descriptors DEC
- DISPERSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; GE SEMICONDUCTOR DETECTORS; HOMOGENEOUS MIXTURES; JUNCTION DETECTORS; LI-DRIFTED DETECTORS; MATERIALS; MEASURING INSTRUMENTS; METALS; MIXTURES; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; SEMIMETALS; SENSITIVITY; SI SEMICONDUCTOR DETECTORS; SOLUTIONS
Optional Information
- Notes
- 7 refs., 2 figs. Imprint:Trudy konferentsii 'Fundamental'nye i prikladnye voprosy fiziki'