Published March 22, 2005 | Version v1
Journal article

Spectro-ellipsometric studies of Au/SiO2 nanocomposite films

  • 1. Department of Molecular Science and Technology, Ajou University, Suwon 442-749 (Korea, Republic of)
  • 2. Division of Electrical Engineering, Ajou University, Suwon 442-749 (Korea, Republic of)
  • 3. Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1 Hawolgok-dong, Sungbuk-gu, Seoul 136-791 (Korea, Republic of)

Description

Au/SiO2 nanocomposite films in which Au nanoparticles were embedded in SiO2 matrix were fabricated via alternating sputtering of SiO2 and Au layers. In particular, we kept the nominal thickness of the Au layers below the threshold for the continuous layer formation whereas that of SiO2 layers was sufficient to form continuous layers. Transmission electron microscopy (TEM) images revealed that the Au nanoparticles were spherical in shape and that their average size was linearly proportional to the nominal thickness of Au layers. To account for the absorption variation of the composite films, including the absorption peak around 530 nm due to the surface plasmon resonance (SPR), we used Maxwell-Garnett effective medium theory (EMT) together with the modified Drude model. As it turned out, the combination of the modified Maxwell-Garnett effective medium theory and the aforementioned modification of the Drude model, which took the size of Au nanoparticles into consideration, were sufficient to model the variable-angle spectroscopic ellipsometry spectra. The values of the fitting parameters, such as film thickness, volume fraction of Au, and the diameter of Au nanoparticles, extracted from the modeling procedure were in good agreement with the results of TEM and spectrophotometer measurements

Additional details

Identifiers

DOI
10.1016/j.tsf.2004.08.045;
PII
S0040-6090(04)01155-1;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
475
Journal Issue
1-2
Journal Page Range
p. 133-138
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
4. Asian-European international conference on plasma surface engineering
Dates
28 Sep - 3 Oct 2003
Place
Jeju City (Korea, Republic of)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36112541
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; ELLIPSOMETRY; FILMS; LAYERS; NANOSTRUCTURES; OPTICAL PROPERTIES; PARTICLES; RESONANCE; SILICON OXIDES; SPECTROPHOTOMETERS; SPHERICAL CONFIGURATION; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
CHALCOGENIDES; CONFIGURATION; ELECTRON MICROSCOPY; MEASURING INSTRUMENTS; MEASURING METHODS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SILICON COMPOUNDS; SORPTION

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.