Published April 11, 2011 | Version v1
Journal article

LTP-V with EPICS controls system for efficient quality assessment of KB-bender systems

  • 1. Paul Scherrer Institut, Swiss Light Source, 5232 Villigen-PSI (Switzerland)

Description

We present a new approach for efficient bender calibration and quality assessment on the example of a KB-mirror system for the refocusing stage at the new PHOENIX beamline of the Swiss Light Source. To reach the target focus of about 2μm FWHM with the strong astigmatic imaging ratio of 70:1 in the vertical- and 50:1 in the horizontal direction the bender system of the mirror has to be carefully calibrated to reach the desired elliptic shape. We use off-line slope measurements with the Long Trace Profiler LTP-V from Ocean Optics in our metrology laboratory. The proprietary controls system of the LTP has been replaced by EPICS to allow automatic synchronized measurements over the whole parameter space of the benders. The data acquisition is implemented as four-dimensional scan using the standard EPICS sscan record. The controls of the hardware has been realized with a genSub record for the CCD detector and a stream device for the motion of the LTP head.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2010.09.114

Additional details

Identifiers

DOI
10.1016/j.nima.2010.09.114;
PII
S0168-9002(10)02147-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
635
Journal Issue
1,Supplement
Journal Page Range
p. S64-S68
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
EuroFEL workshop on photon beamlines and diagnostics
Acronym
PhotonDiag 2010
Dates
28-30 Jun 2010
Place
Hamburg (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42096887
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CALIBRATION; CHARGE-COUPLED DEVICES; CHARGES; CONTROL SYSTEMS; DATA ACQUISITION; FOUR-DIMENSIONAL CALCULATIONS; MIRRORS; STREAMS; SWISS LIGHT SOURCE
Descriptors DEC
RADIATION SOURCES; RIVERS; SEMICONDUCTOR DEVICES; SURFACE WATERS; SYNCHROTRON RADIATION SOURCES

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.