LTP-V with EPICS controls system for efficient quality assessment of KB-bender systems
- 1. Paul Scherrer Institut, Swiss Light Source, 5232 Villigen-PSI (Switzerland)
Description
We present a new approach for efficient bender calibration and quality assessment on the example of a KB-mirror system for the refocusing stage at the new PHOENIX beamline of the Swiss Light Source. To reach the target focus of about 2μm FWHM with the strong astigmatic imaging ratio of 70:1 in the vertical- and 50:1 in the horizontal direction the bender system of the mirror has to be carefully calibrated to reach the desired elliptic shape. We use off-line slope measurements with the Long Trace Profiler LTP-V from Ocean Optics in our metrology laboratory. The proprietary controls system of the LTP has been replaced by EPICS to allow automatic synchronized measurements over the whole parameter space of the benders. The data acquisition is implemented as four-dimensional scan using the standard EPICS sscan record. The controls of the hardware has been realized with a genSub record for the CCD detector and a stream device for the motion of the LTP head.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.09.114Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.09.114;
- PII
- S0168-9002(10)02147-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 635
- Journal Issue
- 1,Supplement
- Journal Page Range
- p. S64-S68
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- EuroFEL workshop on photon beamlines and diagnostics
- Acronym
- PhotonDiag 2010
- Dates
- 28-30 Jun 2010
- Place
- Hamburg (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42096887
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALIBRATION; CHARGE-COUPLED DEVICES; CHARGES; CONTROL SYSTEMS; DATA ACQUISITION; FOUR-DIMENSIONAL CALCULATIONS; MIRRORS; STREAMS; SWISS LIGHT SOURCE
- Descriptors DEC
- RADIATION SOURCES; RIVERS; SEMICONDUCTOR DEVICES; SURFACE WATERS; SYNCHROTRON RADIATION SOURCES
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.