Role of oxygen incorporation in high temperature annealed AlGaN
Creators
- 1. Institute of Nano Optoelectronics Research and Technology (INOR), Universiti Sains Malaysia (USM), Penang, 11800 (Malaysia)
- 2. Ferdinand-Braun-Institut (FBH), Berlin, 12489 (Germany)
Description
High-temperature annealing (HTA) is a powerful technique to decrease dislocation density in AlN, which can also be applied on AlGaN. This work investigates the impact of using sapphire and AlN as a material cover during the face-to-face HTA process on AlGaN (0.55 < x < 0.93) properties. Before HTA, the threading dislocation density (TDD) in the AlGaN for all x was about 6.0 × 10 cm. Meanwhile, after HTA, the sapphire cover led to a further reduction of the TDD at 5.7 × 10 cm for the lowest x and 1.4 × 10 cm for the highest x in comparison to the AlN cover. In most cases, strain relaxation increased by HTA, especially with the sapphire cover. Furthermore, increased optical absorption in HTA AlGaN can be lessened by the sapphire cover. Such absorption compromises the performance of UV LEDs which usually emit through the substrate. These advantages of sapphire over AlN as the cover in the HTA process are associated with additional oxygen incorporation into the AlGaN, most probably from the surface of the sapphire cover. (© 2023 The Authors. physica status solidi (a) applications and materials science published by Wiley‐VCH GmbH)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.202300083Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 220
- Journal Issue
- 11
- Journal Page Range
- p. 1-10
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 54103073
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTRA; ALUMINIUM NITRIDES; ANNEALING; ATOMIC FORCE MICROSCOPY; BAND THEORY; CHEMICAL COMPOSITION; DISLOCATIONS; ENERGY GAP; GALLIUM NITRIDES; ION MICROPROBE ANALYSIS; MASS SPECTROSCOPY; PERFORMANCE; PHOTOLUMINESCENCE; SAPPHIRE; STRAINS; STRESS RELAXATION; SUBSTRATES; VAPOR PHASE EPITAXY; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHEMICAL ANALYSIS; COHERENT SCATTERING; CORUNDUM; CRYSTAL DEFECTS; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; DIFFRACTION; EMISSION; EPITAXY; GALLIUM COMPOUNDS; HEAT TREATMENTS; LINE DEFECTS; LUMINESCENCE; MICROANALYSIS; MICROSCOPY; MINERALS; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE ANALYSIS; OXIDE MINERALS; PHOTON EMISSION; PNICTIDES; RELAXATION; SCATTERING; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- AID: 2300083