Published September 15, 2008 | Version v1
Journal article

Modeling analysis of distribution of irreversible bending strain for critical current in Bi2223-composite tape

  • 1. Graduate School of Engineering, Kyoto University, Yoshida, Sakyo-ku, Kyoto 606-8501 (Japan)
  • 2. Research Institute for Applied Sciences, Sakyo-ku, Kyoto 606-8202 (Japan)
  • 3. National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)
  • 4. Graduate School of Frontier Sciences, University of Tokyo, Kashiwanoha, Kashiwa, Chiba 277-8561 (Japan)

Description

It was attempted to estimate the distribution of irreversible bending strain for critical current of the Bi2223 composite tape. In the modeling, the shape of the core composed of the current transporting Bi2223 filaments and Ag, and the damage strain parameter given by the difference between the intrinsic tensile damage strain and residual strain of the Bi2223 filaments, were incorporated to describe the damage evolution in the core and its relation to critical current. The application of the model to the experimental results of critical current-bending strain relation for many test specimens revealed that the distribution of the irreversible bending strain is described by the two parameter Weibull distribution function. Based on discussion about the influence of the core geometry on the irreversible strain and the result of analysis of the experimental data, a simple and practically useful method was proposed for estimation of the distribution of irreversible bending strain

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physc.2008.05.087

Additional details

Identifiers

DOI
10.1016/j.physc.2008.05.087;
PII
S0921-4534(08)00370-5;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
468
Journal Issue
15-20
Journal Page Range
p. 1796-1800
ISSN
0921-4534
CODEN
PHYCE6

Conference

Title
20. international symposium on superconductivity
Acronym
ISS 2007
Dates
5-7 Nov 2007
Place
Tsukuba (Japan)

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.