Deposition and characterization of nitrides thin films resistant to high temperature oxidation
Creators
- 1. Universidade Federal de Sergipe (UFS), Aracaju, SE (Brazil)
- 2. Pontifícia Universidade Católica do Rio Grande do Sul (PUC-RS), Porto Alegre, RS (Brazil)
- 3. Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, RS (Brazil)
Description
Full text: Nitride transition metal thin films have been extensively used in the last decades due to properties as hardness, wear resistance and mechanical strength. Zirconium nitride (ZrN) and niobium nitride (NbN) are coatings used in mechanical industries due its excellent tribological properties besides corrosion and oxidation resistance. However, these coating have problems to support oxidation in high temperature, once NbN and ZrN oxidize at 400 deg C and 600 deg C, respectively. A possibility to improve the oxidation resistance of ZrN and NbN is the addition of a third chemical element, as silicon or aluminum, forming ZrSiN and NbAlN. However, few studies were founded to verify the influence of these elements in structural and oxidation resistance of these nitrides. In this work were deposited ZrSiN and NbAlN thin films by reactive magnetron sputtering using a AJA Orion 5-HV Sputtering Systems, modifying the amount of silicon and aluminum in each coating. Coatings were characterized as deposited by RBS, nanohardness, GAXRD and SEM. After oxidation tests in different temperatures coatings were analysed by SEM and XRD to verify changes on coatings structure and morphology properties. (author)
Availability note (English)
Available in abstract form only; full text entered in this recordAdditional details
Publishing Information
- Imprint Pagination
- 1 p.
Conference
- Title
- 14. Brazil MRS meeting
- Dates
- 27 Sep - 1 Oct 2015
- Place
- Rio de Janeiro, RJ (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 49066680
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ALUMINIUM; COATINGS; DEPOSITION; MAGNETRONS; NIOBIUM NITRIDES; OXIDATION; SCANNING ELECTRON MICROSCOPY; SILICON; SPUTTERING; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; X-RAY DIFFRACTION; ZIRCONIUM NITRIDES
- Descriptors DEC
- CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NIOBIUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; REFRACTORY METAL COMPOUNDS; SCATTERING; SEMIMETALS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; ZIRCONIUM COMPOUNDS