Doping-induced dielectric and transport properties of Ni1−xZnxO
- 1. Jadavpur University. Department of Physics (India)
Description
Ni1−xZnxO (with 0 ≤ x ≤ 0.05) nanoparticles are synthesized by chemical precipitation method in order to investigate the effect of Zn doping on the dielectric and transport properties of NiO. Prepared samples are characterized by means of X-ray diffraction (XRD) method, scanning electron microscope (SEM), and Transmission electron microscope (TEM). The size of the nanoparticles is calculated and found to be 26 nm and 22 nm for x = 0.0 and 0.05, respectively. Regular increase of the optical band gap with increase in doping concentration (x) is observed which is consistent with the variation of particle size. Frequency (f) dependence of AC (σac) conductivity, dielectric constant (εr), and dielectric loss (tanδ) of Ni1−xZnxO (0 ≤ x ≤ 0.05) has been studied. It is observed that the dielectric constant (εr) increases gradually with x at high frequency (2 MHz). The dc conductivity (σdc) is found to decrease with Zn doping at room temperature which may be attributed to the reduction of oxygen vacancy. The temperature dependence of dielectric properties for x = 0.00, 0.05 are also investigated as a function of f. Cross over of dc conductivity of Ni0.95Zn0.05O to that of NiO observed around ~ 365 K indicates the lowering of activation energy of conductivity for x = 0.05 with increase in temperature.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 31
- Journal Issue
- 15
- Journal Page Range
- p. 12628-12637
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55103270
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACTIVATION ENERGY; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; ENERGY GAP; FREQUENCY DEPENDENCE; NANOPARTICLES; OXYGEN; PARTICLE SIZE; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DEPENDENCE; TRANSMISSION; TRANSMISSION ELECTRON MICROSCOPY; VACANCIES; X-RAY DIFFRACTION; ZINC
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; ENERGY; MATERIALS; METALS; MICROSCOPY; NONMETALS; PARTICLES; PHYSICAL PROPERTIES; POINT DEFECTS; SCATTERING; SIZE
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- Copyright
- Copyright (c) 2020 © Springer Science+Business Media, LLC, part of Springer Nature 2020