Development of large-area silicon photomultiplier detectors for PET applications at FBK
Creators
- 1. Fondazione Bruno Kessler (FBK), Via Sommarive 18, I-38123 Trento Povo (Italy)
Description
This paper reports on the development of large-area silicon photomultiplier (SiPM) detectors specifically designed for positron emission tomography (PET) instruments. The sensors under study are monolithic arrays of two different types: a 2x2 array of ∼4x4 mm2 elements and an 8x8 array of 1.5x1.5 mm2 pixels. These devices are characterized at wafer level by means of an automatic test procedure, consisting of current-voltage curves in forward and reverse bias. The tests allowed selection of functioning devices and evaluation of the uniformity of basic parameters. Results of the electrical characterization are reported showing that acceptable values of yield together with rather uniform distribution of parameters have been obtained. Reliability of produced SiPMs has been proved by long-term accelerated stress tests.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.04.111Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.04.111;
- PII
- S0168-9002(10)00965-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 636
- Journal Issue
- 1,Suppl
- Journal Page Range
- p. S208-S213
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 7. international 'Hiroshima' symposium on the development and application of semiconductor tracking detectors
- Acronym
- HSTD7 Hiroshima
- Dates
- 29 Aug - 1 Sep 2009
- Place
- Hiroshima (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43054019
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DISTRIBUTION; ELECTRIC CONDUCTIVITY; EQUIPMENT; PHOTOMULTIPLIERS; POSITRON COMPUTED TOMOGRAPHY; RELIABILITY; SENSORS; SILICON; STRESSES
- Descriptors DEC
- COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC TECHNIQUES; ELECTRICAL PROPERTIES; ELEMENTS; EMISSION COMPUTED TOMOGRAPHY; PHOTOTUBES; PHYSICAL PROPERTIES; SEMIMETALS; TOMOGRAPHY
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.