Published March 15, 2005
| Version v1
Journal article
Photoionization of Multiply Charged Ions at the Advanced Light Source
Creators
- 1. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley CA 94720 (United States)
- 2. Department of Physics, MS 220, University of Nevada, Reno NV 89557 (United States)
- 3. Institut fuer Atom- und Molekuelphysik, Justus-Liebig-Universitaet, 35392 Giessen (Germany)
- 4. Universidad Nacional Autonoma de Mexico, Cuernavaca (Mexico)
- 5. Queen's University Belfast, BT71NN (United Kingdom)
Description
Photoionization of multiply charged ions is studied using the merged-beams technique at the Advanced Light Source. An ion beam is created using a compact 10-GHz all-permanent-magnet ECR ion source and is accelerated with a small accelerator. The ion beam is merged with a photon beam from an undulator to allow interaction over an extended path. Absolute photoionization cross sections have been measured for a variety of ions along both isoelectronic and isonuclear sequences
Additional details
Identifiers
- DOI
- 10.1063/1.1893373;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 749
- Journal Issue
- 1
- Journal Page Range
- p. 88-91
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 16. international workshop on ECR ion sources
- Acronym
- ECRIS'04
- Dates
- 26-30 Sep 2004
- Place
- Berkeley, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36073531
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADVANCED LIGHT SOURCE; CROSS SECTIONS; CYCLOTRON RESONANCE; ECR ION SOURCES; GHZ RANGE; ION BEAMS; LIGHT SOURCES; PERMANENT MAGNETS; PHOTOIONIZATION; PHOTON BEAMS
- Descriptors DEC
- BEAMS; EQUIPMENT; FREQUENCY RANGE; ION SOURCES; IONIZATION; MAGNETS; RADIATION SOURCES; RESONANCE; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES
Optional Information
- Notes
- (c) 2005 American Institute of Physics