Optical characterization of NaBi(MoO) crystal by spectroscopic ellipsometry
Creators
- 1. Physics, Inter-Curricular Courses Department, Çankaya University, 06530, Ankara (Turkey)
- 2. Department of Electrical and Electronics Engineering, Atilim University, 06836, Ankara (Turkey)
- 3. Virtual International Scientific Research Centre, Baku State University, 1148, Baku (Azerbaijan)
- 4. Department of Physics, Middle East Technical University, 06800, Ankara (Turkey)
Description
The compound NaBi(MoO) has garnered significant interest in optoelectronic fields. This study employs spectroscopic ellipsometry to thoroughly examine the linear and nonlinear optical characteristics of NaBi(MoO) crystals, offering detailed insights into their optical behavior. Our investigation presents a precise method for discerning the crystal's spectral features, revealing the spectral variations of key optical parameters such as refractive index, extinction coefficient, dielectric function, and absorption coefficient within the 1.2-5.0 eV range. Through analysis, we determined optical attributes including bandgap energy, critical point energy, and single oscillator parameters. Additionally, we explored the nonlinear optical properties of NaBi(MoO), unveiling potential applications such as optoelectronic devices, frequency conversion, and optical sensors. This study enhances comprehension of optical properties of NaBi(MoO), underscoring its significance in future optical and electronic advancements.
Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing (Print)
- Journal Volume
- 130
- Journal Issue
- 9
- Journal Page Range
- vp.
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 55102434
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTALS; ELLIPSOMETRY; NONLINEAR PROBLEMS; OPTOELECTRONIC DEVICES; OSCILLATORS; REFRACTIVE INDEX; TUNGSTATES
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; MEASURING METHODS; OPTICAL EQUIPMENT; OPTICAL PROPERTIES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; TRANSDUCERS; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS
Optional Information
- Notes
- AID: 625