Electrochemistry of Sn(II)/Sn in a hydrophobic room-temperature ionic liquid
- 1. Department of Applied Chemistry, Faculty of Science and Technology, Keio University Hiyoshi 3-14-1, Kohoku-ku, Yokohama, Kanagawa 223-8522 (Japan)
Description
The electrochemical reaction of Sn(II)/Sn was investigated in a room-temperature ionic liquid, 1-n-butyl-1-methylpyrrolidinium bis(trifluoromethylsulfonyl)imide (BMPTFSI) at 25 deg. C. The anodic dissolution of Sn metal proceeded by a two-electron transfer reaction with a current efficiency of nearly 100%. Electrodeposition of Sn on a Cu substrate is possible in BMPTFSI containing Sn(II). The formal potential of the Sn(II)/Sn is -0.57 V vs. Ag/Ag(I). The diffusion coefficient of Sn(II) was estimated to be ∼1 x 10-7 cm2 s-1 from chronoamperometric and chronopotentiometric techniques. The initial stage of nucleation of Sn on a polycrystalline Pt substrate was found to be classified into a three-dimensional progressive nucleation under diffusion control by chronoamperometry, suggesting the rate of nucleation is faster than that of crystal growth
Availability note (English)
Available from http://dx.doi.org/10.1016/j.electacta.2008.04.056Additional details
Identifiers
- DOI
- 10.1016/j.electacta.2008.04.056;
- PII
- S0013-4686(08)00567-7;
Publishing Information
- Journal Title
- Electrochimica Acta
- Journal Volume
- 53
- Journal Issue
- 22
- Journal Page Range
- p. 6530-6534
- ISSN
- 0013-4686
- CODEN
- ELCAAV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40001111
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- AMPEROMETRY; CRYSTAL GROWTH; DIFFUSION; ELECTROCHEMISTRY; ELECTRODEPOSITION; ELECTRON TRANSFER; LIQUIDS; NUCLEATION; POLYCRYSTALS; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; TIN; TIN COMPOUNDS
- Descriptors DEC
- CHEMICAL ANALYSIS; CHEMISTRY; CRYSTALS; DEPOSITION; ELECTROLYSIS; ELEMENTS; FLUIDS; LYSIS; METALS; QUANTITATIVE CHEMICAL ANALYSIS; SURFACE COATING; TEMPERATURE RANGE; TITRATION; VOLUMETRIC ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.