Published July 25, 1972
| Version v1
Report
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Some problems of the detection of self-interstitial atoms in field ion microscope images
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.
Files
Restricted
The record is publicly accessible, but files are restricted to users with access.
Additional details
Publishing Information
- Imprint Pagination
- 26 p.
- Report number
- COO--3158-8
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 4051872
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMS; CRYSTAL DEFECTS; EVAPORATION; IMAGES; INTERSTITIALS; ION BEAMS; ION MICROSCOPY; KEV RANGE 10-100; MONOCRYSTALS; RADIATION EFFECTS; TUNGSTEN; TUNGSTEN IONS; VACANCIES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CRYSTAL STRUCTURE; CRYSTALS; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; METALS; MICROSCOPY; PHASE TRANSFORMATIONS; POINT DEFECTS; TRANSITION ELEMENTS