Progress report on the use of hybrid silicon PIN diode arrays in high energy physics
Creators
- 1. Stanford Linear Accelerator Center, Stanford Univ., Stanford, CA (United States)
- 2. Space Sciences Lab., Univ. of California, Berkeley, CA (United States)
Description
This paper reports on the successful effort to develop hybrid PIN diode arrays and to demonstrate their potential as components of vertex detectors. Hybrid pixel arrays have been fabricated by the Hughes Aircraft Co. by bump-bonding readout chips developed by Hughes to an array of PIN diodes manufactured by Micron Semiconductor Inc. These hybrid pixel arrays were constructed in two configurations. One array format has 10 x 64 pixels, each 120 μm square; and the other format has 256 x 256 pixels, each 30 μm square. In both cases, the thickness of the PIN diode layer is 300 μm. Measurements of detector performance show that excellent position resolution can be achieved by interpolation. By determining the centroid of the charge cloud which spreads charge into a number of neighboring pixels, a spatial resolution of a few microns has been attained. The noise has been measured to be about 300 electrons (rms) at room temperature, as expected from KTC and dark current considerations, yielding a signal-to-noise ratio of about 100 for minimum ionizing particles
Additional details
Publishing Information
- Publisher
- World Scientific Pub. Co.
- Imprint Place
- Teaneck, NJ (United States)
- ISBN
- 981-02-0241-5
- Imprint Title
- Instrumentation for colliding beam physics
- Imprint Pagination
- 500 p.
- Journal Page Range
- p. 89-103.
Conference
- Title
- 5. international conference on instrumentation for colliding beam physics.
- Dates
- 15-21 Mar 1990.
- Place
- Novosibirsk (USSR).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23054550
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COORDINATES; FABRICATION; HIGH ENERGY PHYSICS; HYBRID SYSTEMS; INTERPOLATION; IONIZATION; PERFORMANCE; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DIODES; SIGNAL-TO-NOISE RATIO; SILICON; TEMPERATURE RANGE 0273-0400 K; USES; VERTEX FUNCTIONS
- Descriptors DEC
- ELEMENTS; FUNCTIONS; MEASURING INSTRUMENTS; NUMERICAL SOLUTION; PHYSICS; SEMICONDUCTOR DEVICES; SEMIMETALS; TEMPERATURE RANGE
Optional Information
- Secondary number(s)
- CONF-9003150--.