Published June 2008
| Version v1
Journal article
CREPT-MCNP code for efficiency calibration of HPGe detectors with the representative point method
Creators
- 1. Department of Radiation Protection, Nuclear Science Research Institute, Tokai Research and Development Center, Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195 (Japan)
Description
The representative point method for the efficiency calibration of volume samples has been previously proposed. For smoothly implementing the method, a calculation code named CREPT-MCNP has been developed. The code estimates the position of a representative point which is intrinsic to each shape of volume sample. The self-absorption correction factors are also given to make correction on the efficiencies measured at the representative point with a standard point source. Features of the CREPT-MCNP code are presented
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apradiso.2008.02.023Additional details
Identifiers
- DOI
- 10.1016/j.apradiso.2008.02.023;
- PII
- S0969-8043(08)00055-9;
Publishing Information
- Journal Title
- Applied Radiation and Isotopes
- Journal Volume
- 66
- Journal Issue
- 6-7
- Journal Page Range
- p. 774-779
- ISSN
- 0969-8043
- CODEN
- ARISEF
Conference
- Title
- 16. international conference on radionuclide metrology and its applications
- Dates
- 3-7 Sep 2007
- Place
- Cape Town (South Africa)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39115469
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALIBRATION; EFFICIENCY; GAMMA RADIATION; HIGH-PURITY GE DETECTORS; POINT SOURCES; SELF-ABSORPTION; STANDARDS
- Descriptors DEC
- ABSORPTION; ELECTROMAGNETIC RADIATION; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; SEMICONDUCTOR DETECTORS; SORPTION
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.