Published 2000
| Version v1
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Size analysis of crystallites in Si nanocrystal layer obtained by hydrogen ion implantation
Creators
- 1. NIIYaF MGU, Moscow (Russian Federation)
- 2. IFP SO RAN, Novosibirsk (Russian Federation)
Description
no abstract available
Files
34047533.pdf
Files
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Additional details
Additional titles
- Original title (Russian)
- Анализ размеров кристаллов в нанокристаллическом слое Си, полученном имплантацией ионов водорода
Publishing Information
- Publisher
- MGU
- Imprint Place
- Moscow (Russian Federation)
- Imprint Title
- Theses of reports of the 30. International conference on physics of interaction of charged particles with crystals
- Imprint Pagination
- 162 p.
- Journal Page Range
- p. 81
- Report number
- INIS-RU--460
Conference
- Title
- 30. International conference on physics of interaction of charged particles with crystals
- Original Conference Title
- 30. Mezhdunarodnaya konferentsiya po fizike vzaimodejstviya zaryazhennykh chastits s kristallami
- Dates
- 29-31 May 2000
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 34047533
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- CHANNELING; GRAIN SIZE; HYDROGEN IONS; ION BEAMS; ION IMPLANTATION; SILICON
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELEMENTS; IONS; MICROSTRUCTURE; SEMIMETALS; SIZE
Optional Information
- Notes
- 1 ref. Imprint:Tezisy dokladov 30. Mezhdunarodnoj konferentsii po fizike vzaimodejstviya zaryazhennykh chastits s kristallami