Optical characteristics of (La, Ce)B6 films deposited on silicon substrates by e-beam evaporation process

Oriented (100) polycrystalline thin films of (La, Ce)B6 with 1 at.% Ce have been deposited on (111) silicon substrates at different substrate temperatures between 600 and 860 deg. C by electron-beam evaporation. Optical reflectivity, X-ray diffraction and electrical resistivity have been systematically studied. The effective optical constants (ε, σ, -Im ε-1, ωp) of the (La, Ce)B6 films are calculated by Kramers-Kronig transformation of the reflectivity spectra and analyzed by a modified Drude model. The results show that the electronic and optical parameters of (La, Ce)B6 films depend on substrate deposition temperature and substrate material. These effects are discussed