Published March 25, 2005 | Version v1
Miscellaneous Metadata-only

Polymer film dynamics with coherent x-ray scattering

Creators

Description

Surface x-ray photon correlation spectroscopy (SXPCS) is applied for probing the dynamics of surface height fluctuations as a function of lateral length scale. We present the first experimental verification of the theoretical predictions for the thickness, wave vector, and temperature dependence of the capillary wave relaxation times for the supported polymer films above the glass transition temperature. Measurements were performed on polystyrene (PS) films of thicknesses varying from 84 to 333 nm.

Availability note (English)

Available from AIP; Volume 708, pages 213-216

Additional details

Publishing Information

Imprint Pagination
4 p.

Conference

Title
3. International Symposium on Slow Dynamics in Complex Systems
Dates
3-8 Nov 2003
Place
Sendai (Japan)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
42049764
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
FLUCTUATIONS; GLASS; PHOTONS; POLYMERS; POLYSTYRENE; RELAXATION TIME; SCATTERING; SPECTROSCOPY; TEMPERATURE DEPENDENCE; THICKNESS; TRANSITION TEMPERATURE; VERIFICATION
Descriptors DEC
BOSONS; DIMENSIONS; ELEMENTARY PARTICLES; MASSLESS PARTICLES; MATERIALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; PHYSICAL PROPERTIES; PLASTICS; POLYMERS; POLYOLEFINS; POLYVINYLS; SYNTHETIC MATERIALS; THERMODYNAMIC PROPERTIES; VARIATIONS

Optional Information

Funding organization
US Department of Energy (United States)