Published 2018
| Version v1
Miscellaneous
Open
Defects in Sb2Se3 thin films
Creators
- González, Juan Carlos1
- Fernandes, Willians Principe1
- Carvalho, Vagner Eustaquio de1
- Soares, Edmar A.1
- Silva, Maria Ivonete da1
- Shongalova, Aigul2
- Correia, Maria Rosário2
- Teixeira, Jennifer Claudia Passos2
- Leitão, Joaquim Pratas2
- Ranjbarrizi, Samaneh3
- Garud, Siddhartha3
- Vermang, Bart3
- Cunha, Jose M.V.4
- Fernandes, Paulo5
- Brazilian Materials Research Society (B-MRS), Rio de Janeiro, RJ (Brazil)
- 1. Universidade Federal de Minas Gerais (UFMG), MG (Brazil)
- 2. Universidade de Aveiro (Portugal)
- 3. IMEC (Brazil)
- 4. International Iberian Nanotechnology Laboratory (INL), Braga (Portugal)
- 5. Instituto Superior de Engenharia do Porto (ISEP) (Portugal)
Description
no abstract available
Files
50005038.pdf
Files
(57.0 kB)
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Additional details
Publishing Information
- Imprint Pagination
- 2 p.
- Report number
- INIS-BR--21632
Conference
- Title
- 17. Brazilian MRS meeting
- Dates
- 16-20 Sep 2018
- Place
- Natal, RN (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 50005038
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- DEFECTS; ELECTRICAL PROPERTIES; ELLIPSOMETRY; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SELENIUM; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; LASER SPECTROSCOPY; MEASURING METHODS; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SEMIMETALS; SPECTROSCOPY