Published May 21, 2014
| Version v1
Journal article
An implantation and β detection system applied in β-decay studies
Creators
- 1. School of Physics and State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871 (China)
- 2. Tohoku University, Kawauchi, Aoba-ku, Sendai 980-8576 (Japan)
- 3. College of Nuclear Science and Technology, Harbin Engineering University, Harbin 150001 (China)
- 4. Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000 (China)
Description
To study the β decays of nuclei far from the β-stability line, an implantation and β detection system has been implemented at the Peking University. This detection system covers a wide energy range from keV to GeV while maintaining a good energy resolution and a low detection threshold. By correlating the implantation nuclei with their subsequent β-decays within the same pixel or adjacent pixels of a double-sided silicon detector (DSSD), the β decay properties of implanted nuclei can be measured with much less disturbance from other unstable nuclei and the random background
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2014.02.023Additional details
Identifiers
- DOI
- 10.1016/j.nima.2014.02.023;
- PII
- S0168-9002(14)00179-X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 747
- Journal Page Range
- p. 52-55
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46019762
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BETA DECAY; BETA DETECTION; CORRELATIONS; DETECTION; EDUCATIONAL FACILITIES; ENERGY RESOLUTION; GEV RANGE; KEV RANGE; NUCLEI; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DECAY; DETECTION; ENERGY RANGE; MEASURING INSTRUMENTS; NUCLEAR DECAY; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.