Published 2011
| Version v1
Miscellaneous
Beam focusing and defocusing using channeling phenomena
Creators
- 1. SAGA Light Source, Tosu, Saga (Japan)
- 2. Kharkov Institute of Physics and Technology, Kharkov (Ukraine)
Description
If a charged particle is incident on a single crystal along its axis or plane, the motion of the charged particle is guided by the potential of atomic row or plane in the crystal. This phenomenon is called "channeling". In this study, we propose a new method for beam focusing and defocusing using channeling phenomena in a bent crystal. As the first step, we have observed axial and planar channeling of 255-MeV electrons in a flat silicon crystal. (author)
Additional details
Identifiers
Publishing Information
- Imprint Title
- Proceedings of the 8th annual meeting of Particle Accelerator Society of Japan
- Imprint Pagination
- [1377 p.]
- Journal Page Range
- [4 p.]
Conference
- Title
- 8. annual meeting of Particle Accelerator Society of Japan
- Dates
- 1-3 Aug 2011
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 45043371
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ACCELERATORS; CONTROL; CRYSTALS; ELECTROMAGNETIC FIELDS; ELECTRON BEAMS; ELECTRON CHANNELING; FOCUSING; GONIOMETERS; ION BEAMS; ION CHANNELING; POSITRON CHANNELING; PROTON CHANNELING
- Descriptors DEC
- BEAMS; CHANNELING; LEPTON BEAMS; MEASURING INSTRUMENTS; PARTICLE BEAMS
Optional Information
- Notes
- 7 refs., 8 figs., 2 tabs.