Published July 15, 2011 | Version v1
Journal article

Molecular dynamics study on carbon film deposition

  • 1. Okayama University of Science, Ridai-cho 1-1, Okayama 700-0005 (Japan)
  • 2. Yokohama National University, Tokiwadai 79-1, Hodogaya-ku, Yokohama 240-8501 (Japan)
  • 3. Sojo University, Ikeda 4-22-1, Kumamoto 860-0082 (Japan)
  • 4. Doshisha University, Tatara Miyakodani 1-3, Kyotanabe 610-0394 (Japan)

Description

Hydrogen-free carbon film deposition is studied through molecular dynamics (MD) simulation. MD simulation is performed for low-energy carbon particle impacts on carbon surfaces at room temperature. Deposition energy is considered up to E = 100 eV per carbon atom. Deposited surface is set into amorphous, and (1 1 1) surface of diamond crystal is considered in order to compare. For (1 1 1) surface, we found three characteristic regions. The deposition frequently results in the shallow trapping in E ≤ 20 eV. In E ≥ 30 eV, the deep trapping occurs about normal incidence, and the reflection appears about grazing incidence. For the amorphous surface, however, the reflection and the deep trapping are suppressed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2010.11.015

Additional details

Identifiers

DOI
10.1016/j.nimb.2010.11.015;
PII
S0168-583X(10)00833-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
269
Journal Issue
14
Journal Page Range
p. 1752-1754
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
10. international conference on computer simulations of radiation effects in solids
Dates
19-23 Jul 2010
Place
Krakow (Poland)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43055832
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTALS; DEPOSITION; DIAMONDS; EV RANGE; MOLECULAR DYNAMICS METHOD; REFLECTION; SPUTTERING; SURFACES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TRAPPING
Descriptors DEC
CALCULATION METHODS; CARBON; ELEMENTS; ENERGY RANGE; FILMS; MINERALS; NONMETALS; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.