Published April 1, 2011 | Version v1
Journal article

Nano-scale and surface precipitation of metallic particles in laser interference patterned noble metal-based thin films

  • 1. Department of Materials Science and Engineering, Chair of Functional Materials, Saarland University, Campus D3.3, D-66123 Saarbruecken (Germany)
  • 2. Institut Jean Lamour, Departement CP2S, UMR 7198 CNRS-Nancy-Universite-UPV-Metz, Ecole des Mines de Nancy, Parc de Saurupt, CS14234, F-54042 Nancy (France)

Description

Laser interference patterning (also known as 'laser interference metallurgy') is used to locally tailor the microstructure of oxide (Pd0.25Pt0.75Ox) and nitride (Cu3N) thin films to induce a chemical decomposition, which is responsible for a decrease of electrical resistivity. This technique allows hereby a laser-induced chemical decomposition of as-deposited oxide and nitride films, resulting locally in a porous microstructure due to the simultaneous emission of gaseous nitrogen and oxygen. The process locally generates at the nanometer scale metal precipitatation of Pt or Cu in the oxide or nitride matrix. Thus, isolated metallic clusters with low resistivity coexist with a high resistivity phase, establishing a preferential electrical conduction path and giving the system a lower effective resistivity. The decomposition process is investigated by four-point probe method, X-ray diffraction, spectrophotometry, white light interference, scanning and transmission electron microscopies.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2010.11.060

Additional details

Identifiers

DOI
10.1016/j.apsusc.2010.11.060;
PII
S0169-4332(10)01583-7;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
257
Journal Issue
12
Journal Page Range
p. 5223-5229
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
Symposium R - Laser processing and diagnostics for micro and nano applications
Acronym
E-MRS 2010 spring meeting
Dates
7-11 Jun 2010
Place
Strasbourg (France)

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.