Ce-doped EuO: Magnetic properties and the indirect band gap
- 1. Department of Physics and Astronomy, University of Wyoming, Laramie, Wyoming 82071 (United States)
- 2. Department of Physics and Astronomy and Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0299 (United States)
Description
We have prepared and investigated thin films of EuO doped with the rare-earth element cerium. X-ray diffraction, scanning electron microscopy, and energy dispersive x-ray spectroscopy were used to determine the quality of these films prepared by pulsed laser deposition. Ce doping leads to an enhanced Curie temperature near 150 K, close to that seen for oxygen-deficient EuO1-x. However, the magnetization of Ce-doped EuO exhibits differences from that observed for Gd-doped and oxygen-deficient samples. The high-resolution angular-resolved photoemission from Ce-doped EuO reveals filling of conduction-band states near the X point. This indicates that the band gap in EuO is indirect, and that at 2% doping Ce-doped EuO1-x is at least semimetallic.
Additional details
Identifiers
- DOI
- 10.1063/1.3544478;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 109
- Journal Issue
- 7
- Journal Page Range
- p. 07C311-07C311.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
Conference
- Title
- 55. annual conference on magnetism and magnetic materials
- Dates
- 14-18 Nov 2010
- Place
- Atlanta, GA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43037664
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERIUM ADDITIONS; CURIE POINT; DOPED MATERIALS; ENERGY BEAM DEPOSITION; ENERGY GAP; EUROPIUM OXIDES; FERROMAGNETIC MATERIALS; LASER RADIATION; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PULSED IRRADIATION; RESOLUTION; SCANNING ELECTRON MICROSCOPY; TEMPERATURE RANGE 0065-0273 K; THIN FILMS; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALLOYS; CERIUM ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; EMISSION; EUROPIUM COMPOUNDS; FILMS; IONIZING RADIATIONS; IRRADIATION; MAGNETIC MATERIALS; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH ADDITIONS; RARE EARTH ALLOYS; RARE EARTH COMPOUNDS; SCATTERING; SECONDARY EMISSION; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; SURFACE COATING; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE
Optional Information
- Notes
- (c) 2011 American Institute of Physics