Influence of applied voltage on optimal performance and durability of tungsten and vanadium oxide co-sputtered thin films for electrochromic applications
- 1. College of Material Science and Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016 (China)
- 2. Jiangsu Key Laboratory of Electrochemical Energy Storage Technologies, Nanjing University of Aeronautics and Astronautics, Nanjing 210016 (China)
Description
Highlights: • Effect of potential on durability of undoped and V doped WO3 electrochromic films. • Enhanced electrochromic features including much reduced bleaching time. • More than 50% of transmission modulation between colored and bleached phases. In this research, tungsten and vanadium oxide co-sputtered thin films are evaluated for electrochromic properties based on the effects of applied cyclic voltages of −0.7 V, −1.0 V and −1.3 V for 9600 s. XRD patterns reveal the appearance of new peaks after completion of −1.3 V cycles, these peaks are not seen after lower voltage scans. SEM images also verify severely damaged morphologies. Chronoamperometry (CA) scan of −1.3 V shows a drastic reduction in current density value to as low as 32% for bleaching and 26% for coloring respectively. This is because of the lesser intercalation and de-intercalation as a result of damaged and disturbed orientation. Whereas the films with −1.0 V testing cycles shows the current density drop to 93% and 88% for bleaching and coloring respectively. A remarkable discovery in switching times of WO3-V2O5 co-sputtered thin films is also achieved. Coloring and bleaching times are drastically reduced to 5.5 s and ‹1.3 s as compared to only WO3 films having these values as 13.4 and 4.1 s respectively. We further investigates electrochromic films for different states and concentrations by XPS, electrochemical impedance spectroscopy (EIS) for electronic/ionic conductivity comparison and visible spectroscopy to verify optical modulation and calculation of some optical constants.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2020.147873Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2020.147873;
- PII
- S0169433220326301;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 536
- Journal Page Range
- vp.
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54078400
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BLEACHING; COLOR; CURRENT DENSITY; DOPED MATERIALS; ELECTRIC POTENTIAL; ELECTROCHROMISM; IONIC CONDUCTIVITY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TUNGSTATES; TUNGSTEN OXIDES; VANADIUM OXIDES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRO-OPTICAL EFFECTS; FILMS; MATERIALS; MICROSCOPY; OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2020 Elsevier B.V. All rights reserved.