New 20-channel diagnostic for angle-resolved fast particles measurements in LHD
- 1. Graduate University for Advanced Studies, Hayama, Kanagawa (Japan)
- 2. National Institutes of National Sciences, National Institute for Fusion Science, Toki, Gifu (Japan)
Description
A new multi-channel diagnostic for fast particles has been developed and successfully tested on the Large Helical Device (LHD) during 2005-2006 experimental campaign. The number of simultaneously used channels was significantly improved from 2 to 20 channels and additional improvements for noise reduction have been made. Same time location of the diagnostic has been changed that allowed one to make measurements in a much wider range of pitch angles from perpendicular to tangential (90-160 degrees). All these improvements allow one to make time, energy, and angle-resolved measurements of charge exchange neutral particles in a single plasma discharge and to check the presence of fast particles loss-cones from LHD plasma in different heating regimes. This new diagnostic can be a very helpful and powerful tool in studying of fast particle distribution in such a complex helical plasma geometry like the one of LHD. Example data from plasma discharges are presented. (author)
Additional details
Publishing Information
- Journal Title
- Plasma and Fusion Research
- Journal Volume
- 2
- Journal Issue
- special issue
- Journal Page Range
- p. S1073.1-S1073.4
- ISSN
- 1880-6821
Conference
- Title
- 16. international Toki conference on advanced imaging and plasma diagnostics
- Acronym
- ITC-16
- Dates
- 5-8 Dec 2006
- Place
- Toki, Gifu (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 39119134
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR DISTRIBUTION; BEAM INJECTION HEATING; CHANNELING; CHARGE EXCHANGE; DISTRIBUTION FUNCTIONS; ECR HEATING; ENERGY SPECTRA; ICR HEATING; LHD DEVICE; MEASURING METHODS; NEUTRAL PARTICLE ANALYZERS; PLASMA DIAGNOSTICS; POSITION SENSITIVE DETECTORS; SI SEMICONDUCTOR DETECTORS; TAIL IONS
- Descriptors DEC
- CHARGED PARTICLES; CLOSED PLASMA DEVICES; DISTRIBUTION; FUNCTIONS; HEATING; HIGH-FREQUENCY HEATING; IONS; MEASURING INSTRUMENTS; PLASMA HEATING; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROMETERS; THERMONUCLEAR DEVICES