Published March 1988
| Version v1
Journal article
Angular correlation studies of thin metal films
Creators
- 1. AN SSSR, Moscow (USSR). Inst. Khimicheskoj Fiziki
- 2. AN SSSR, Moscow (USSR)
Description
Thin metal films of Cu (6, 2, and 0.3 μm), Ta (0.3 μm), and Cr (0.3 μm) on a silicon monocrystal surface (100), which was preliminary coated with a 0.5 μm SiO2 film for preserving the surface monocrystallinity, were investigated by angular correlation of positron annihilation radiation. It is demonstrated that the traditional angular correlation technique can provide valuable information on electron properties of the surface
Additional details
Publishing Information
- Journal Title
- Crystal Research and Technology
- Journal Volume
- 23
- Journal Issue
- 3
- Series
- Cryst. Res. Technol.
- Journal Page Range
- 431-435
- ISSN
- 0232-1300
- CODEN
- CRTED
Conference
- Title
- European meeting on positron studies of defects (PSD 87).
- Dates
- 23-27 Mar 1987.
- Place
- Wernigerode (German Democratic Republic).
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- German Democratic Republic
- INIS RN
- 20038689
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR CORRELATION; ANNIHILATION; CHROMIUM; COPPER; ELECTRON-POSITRON INTERACTIONS; ELECTRONIC STRUCTURE; FEASIBILITY STUDIES; MONOCRYSTALS; POSITRONS; SILICON; SILICON OXIDES; TANTALUM; THIN FILMS
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; CHALCOGENIDES; CORRELATIONS; CRYSTALS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FILMS; INTERACTIONS; LEPTON-LEPTON INTERACTIONS; LEPTONS; MATTER; METALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE INTERACTIONS; SEMIMETALS; SILICON COMPOUNDS; TRANSITION ELEMENTS