Published May 1980
| Version v1
Journal article
Mirror reflectivities from 50-150 eV
Creators
- 1. National Bureau of Standards, Washington, DC (USA). Synchrotron Ultraviolet Radiation Facility
- 2. National Aeronautics and Space Administration, Greenbelt, MD (USA). Goddard Space Flight Center
Description
An accurate reflectometer has been set up on the 2.2 m monochromator at the NBS SURF-II synchrotron radiation facility to determine optical constants of materials from 50-150 eV. Properties of the monochromator, reflectometer and NBS windowless photodiode detector are discussed. Reflectively data from 7-30 nm for two low expansion materials, a recrystallized glass (A) and a high silica glass (B), are reported and preliminary optical constants for one glass are presented. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods
- Journal Volume
- 172
- Journal Issue
- 1/2
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 297-301
- ISSN
- 0029-554X
Conference
- Title
- National conference on synchrotron radiation instrumentation.
- Dates
- 4 - 6 Jun 1979.
- Place
- Gaithersburg, MD.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 11566160
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EV RANGE 10-100; EV RANGE 100-1000; GLASS; MIRRORS; MONOCHROMATORS; OPTICAL PROPERTIES; PHOTODIODES; REFLECTION; SILICATES; SYNCHROTRON RADIATION; X-RAY SPECTROMETERS
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ENERGY RANGE; EV RANGE; MEASURING INSTRUMENTS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SILICON COMPOUNDS; SPECTROMETERS