Published May 2021 | Version v1
Journal article

Optimal transportation of grain boundaries: A forward model for predicting migration mechanisms

  • 1. Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213 (United States)
  • 2. Department of Mechanical and Aerospace Engineering, University of Colorado, Colorado Springs, CO (United States)

Description

It has been hypothesized that the most likely atomic rearrangement mechanism during grain boundary (GB) migration is the one that minimizes the lengths of atomic displacements in the dichromatic pattern. In this work, we recast the problem of atomic displacement minimization during GB migration as an optimal transport (OT) problem. Under the assumption of a small potential energy barrier for atomic rearrangement, the principle of stationary action applied to GB migration is reduced to the determination of the Wasserstein metric for two point sets. In order to test the minimum distance hypothesis, optimal displacement patterns predicted on the basis of a regularized OT based forward model are compared to molecular dynamics (MD) GB migration data for a variety of GB types and temperatures. Limits of applicability of the minimum distance hypothesis and interesting consequences of the OT formulation are discussed in the context of MD data analysis for twist GBs, general Σ3 twin boundaries and a tilt GB that exhibits shear coupling. The forward model may be used to predict atomic displacement patterns for arbitrary disconnection modes and a variety of metastable states, facilitating the analysis of multimodal GB migration data.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2021.116823

Additional details

Identifiers

DOI
10.1016/j.actamat.2021.116823;
PII
S1359645421002032;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
210
Journal Page Range
vp.
ISSN
1359-6454
CODEN
ACMAFD

Optional Information

Copyright
Copyright (c) 2021 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.