Double core hole spectroscopy with synchrotron radiation
Creators
- 1. CNRS, LCPMR (UMR 7614), 11 rue P. et M. Curie, 75231, Paris Cedex 05 (France)
- 2. Sorbonne Université, UPMC, Université Paris 06, LCPMR, 11 rue P. et M. Curie,75231, Paris Cedex 05 (France)
- 3. Department of Chemistry, Tokyo Institute of Technology, O-okayama, Tokyo, 152-8551 (Japan)
- 4. Photon Factory, Institute of Materials Structure Science, Oho, Tsukuba, 305-0801 (Japan)
- 5. Institute for Molecular Science, Okazaki, 444-8585 (Japan)
- 6. Institute of Physics, University of Belgrade, Pregrevica118, 11080, Belgrade (Serbia)
- 7. Jožef Stefan Institute, P. O. Box 3000, SI-1001, Ljubljana (Slovenia)
- 8. Department of Environmental Science, Niigata University, Niigata, 950-2181 (Japan)
- 9. University of Connecticut, Physics Department, Storrs, CT, 06269 (United States)
- 10. SAGA Light Source, 8-7 Yayoigaoka, Tosu, Saga, 841-0005 (Japan)
Description
In the last five years, a strong experimental and theoretical activity has been dedicated to the study of inner-shell double photoionization. Almost simultaneously, between 2009 and 2011, different experiments were performed using two different light sources: well established third generation synchrotron light sources that exist for more than two decades and recently developed x-ray free electron lasers (X-FEL) that provide brightness of about 10 orders of magnitude higher. The high photon flux of X-FEL has made possible the successive absorption of many x-ray photons by inner-shell electrons in femtosecond timescale. The possibility to create multiple inner-shell vacancies with this new X-FEL light source has resuscitated "prophetic" 25 years old calculations by Cederbaum et al. [1,2] concerning double K-shell ionization that could be of great interest when conventional Electron Spectroscopy for Chemical Analysis (ESCA) finds some limitations. As a feedback, this has stimulated new theoretical developments. On the other hand, it was considered practically out of reach to observe such states with conventional third generation synchrotron light sources due to the very weak probability to eject two inner-shell electrons by a single photon when the dominant process, that could mask everything else, is single inner-shell ionization. However, due to the development of very efficient detection techniques, it was also possible to perform spectroscopy of double core-hole states with excellent accuracy using third generation synchrotron sources. In this paper we give an outlook on the basis of recently published results, of the complementarity of these light sources for double core-hole spectroscopy. Some new developments and results are also presented with a prospective of what could be done in the future with the technical breakthrough that will be necessary to improve our further understanding of chemical analysis.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2015.06.015Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2015.06.015;
- PII
- S0368-2048(15)00145-0;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 204
- Journal Issue
- Part B
- Journal Page Range
- p. 303-312
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48009318
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- BRIGHTNESS; CHEMICAL ANALYSIS; ELECTRON SPECTROMETERS; ELECTRONS; FREE ELECTRON LASERS; HOLES; INNER-SHELL IONIZATION; K SHELL; LIGHT SOURCES; PHOTOIONIZATION; PHOTONS; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES; SYNCHROTRONS; TIME-OF-FLIGHT METHOD; VACANCIES; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ACCELERATORS; BOSONS; BREMSSTRAHLUNG; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CYCLIC ACCELERATORS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; ELEMENTARY PARTICLES; FERMIONS; IONIZATION; IONIZING RADIATIONS; LASERS; LEPTONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; POINT DEFECTS; RADIATION SOURCES; RADIATIONS; SPECTROMETERS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.