Published December 1999 | Version v1
Journal article Metadata-only

Single event upset characterization of the Pentium MMX and Pentium II microprocessors using proton irradiation

Creators

Description

Experimental single event upset characterization of the Pentiumregsign MMX and PentiumregsignII microprocessors using proton irradiation are presented. Results show the Pentium II processor core cross-section is ten times that of the MMX

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
46
Journal Issue
6Pt1
Journal Page Range
p. 1453-1460
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
1999 IEEE Nuclear and Space Radiation Effects Conference
Dates
12-16 Jul 1999
Place
Norfolk, VA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
31023796
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FAILURES; MICROPROCESSORS; PHYSICAL RADIATION EFFECTS; PROTONS; SENSITIVITY
Descriptors DEC
BARYONS; CATIONS; CHARGED PARTICLES; ELECTRONIC CIRCUITS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; HYDROGEN IONS; HYDROGEN IONS 1 PLUS; IONS; MICROELECTRONIC CIRCUITS; NUCLEONS; RADIATION EFFECTS