Published December 25, 2017 | Version v1
Journal article

Effect of substrate temperature on the microstructure and properties of Be2C films: Aim to advance its applications as ICF ablator

  • 1. Research Center of Laser Fusion, Chinese Academy of Engineering Physics, Mianyang 621900 (China)
  • 2. Science and Technology on Plasma Physics Laboratory, Mianyang 621900 (China)
  • 3. IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240 (China)

Description

Beryllium carbide films were deposited on quartz substrates by DC reactive magnetron sputtering of beryllium in the mixture of CH4-Ar plasma. The influence of substrate temperature on the composition, microstructure and optical properties were characterized by suitable analytical techniques. Experimental results revealed that the composition is independent of substrate temperature and all films are mainly composed of Be2C. Untextured polycrystalline Be2C coatings with smooth surface (Ra < 4 nm) were obtained at low substrate temperature (85–175 °C), while it evolved into porous columnar crystal structure with rougher surface as the temperature increasing. These films exhibited fine grains (<26 nm) and high densities. High speed deposition (>220 nm/h) of Be2C films was realized in this work, representing the current highest deposition rate by reactive magnetron sputtering. The optical measurements showed an average transmittance ∼40% in visible region and ∼84% in near-infrared region for Be2C films. The optical bandgap, evaluated by Tauc's method, was about 1.9 eV despite of substrate temperature. This work represents a significant step toward preparing high quality Be2C films and benefits the application of Be2C as ICF ablator. - Highlights: • Be2C films are efficiently prepared by DC reactive magnetron sputtering. • The microstructure is subjected to the substrate temperature while composition is not. • High quality (Ra < 5 nm, ρ ∼ 2.13 g/cm3) Be2C films are obtained at proper temperature. • The optical bandgap of polycrystal Be2C films are firstly investigated and are ∼1.9 eV.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2017.08.185

Additional details

Identifiers

DOI
10.1016/j.jallcom.2017.08.185;
PII
S0925-8388(17)32914-6;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
728
Journal Page Range
p. 71-77
ISSN
0925-8388
CODEN
JALCEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49073567
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BERYLLIUM CARBIDES; DEPOSITION; DEPOSITS; FILMS; MAGNETRONS; MICROSTRUCTURE; OPTICAL PROPERTIES; SPUTTERING; SUBSTRATES
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; BERYLLIUM COMPOUNDS; CARBIDES; CARBON COMPOUNDS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; MICROWAVE EQUIPMENT; MICROWAVE TUBES; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.