Published 2001
| Version v1
Report
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Non destructive analysis of shielded highly enriched uranium
Creators
- 1. Los Alamos National Laboratory, Los Alamos, NM (United States)
Description
Arms control and special nuclear material reduction requirements will eventually encompass shielded highly enriched uranium (HEU) systems. Non-destructive analysis (NDA) techniques for plutonium such as neutron multiplicity measurements and analysis are well developed and provide information regarding the properties of plutonium systems. In a previous study we developed a NDA method for determining the mass and neutron multiplication of subcritical bare metal systems of HEU. In this work we present results for a HEU sphere enclosed within various shielding materials of low density, (carbon and beryllium), medium density (iron) and high density (lead)
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Additional details
Publishing Information
- Imprint Title
- Symposium on international safeguards: Verification and nuclear material security. Book of extended synopses
- Imprint Pagination
- 377 p.
- Journal Page Range
- p. 354-355
- Report number
- IAEA-SM--367
Conference
- Title
- Verification and nuclear material security
- Acronym
- Symposium on international safeguards
- Dates
- 29 Oct - 2 Nov 2001
- Place
- Vienna (Austria)
INIS
- Country of Publication
- International Atomic Energy Agency (IAEA)
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33007073
- Subject category
- S98: NUCLEAR DISARMAMENT, SAFEGUARDS AND PHYSICAL PROTECTION;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARMS CONTROL; HE-3 COUNTERS; HIGHLY ENRICHED URANIUM; MEV RANGE 10-100; NEUTRON DETECTION; NEUTRON SOURCES; NONDESTRUCTIVE ANALYSIS; NUCLEAR MATERIALS MANAGEMENT; SHIELDING MATERIALS
- Descriptors DEC
- ACTINIDES; CHEMICAL ANALYSIS; DETECTION; ELEMENTS; ENERGY RANGE; ENRICHED URANIUM; ISOTOPE ENRICHED MATERIALS; MANAGEMENT; MATERIALS; MEASURING INSTRUMENTS; METALS; MEV RANGE; NEUTRON DETECTORS; PARTICLE SOURCES; PROPORTIONAL COUNTERS; RADIATION DETECTION; RADIATION DETECTORS; RADIATION SOURCES; URANIUM
Optional Information
- Notes
- 4 refs, 1 fig., 1 tab
- Secondary number(s)
- IAEA-SM--367/17/06